Kieff, Newman, Schwartz and Smith's Principles of Patent Law, 5th edition

Author: F. Scott Kieff; Pauline Newman; Herbert F. Schwartz; Henry E. Smith
Publisher: Thomson West
ISBN: 9781599416502
Published In: June 2011
Format: Paperback , 1442 pages
Jurisdiction: U.S. ? Disclaimer:
Countri(es) stated herein are used as reference only

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The fifth edition builds on the strengths of prior editions in providing a unique combination of the law and economic theory of patents with extensive and diverse legal analyses and practitioner insights. Updated to address the extensive developments that have arisen over the past few years, the edition offers a wealth of supplementary materials on the accompanying website, plus full versions of background documents, such as patent files and important cases, extra reading, and special materials designed to help students during their studies, as well as while seeking a job. Supplementary materials include syllabi, teaching notes, sample exams, and sample answers.

F. Scott Kieff

Associate Professor of Law, Washington University

Pauline Newman

Circuit Judge, United States Court of Appeals for the Federal Circuit, and Distinguished Professor of Law, George Mason University School of Law.

Herbert F. Schwartz

Schwartz is a Senior Partner of Fish & Neave in New York, NY. He is a Fellow of the American College of Trial Lawyers and The American Bar Foundation, and a member of the American Law Institute. He has been with Fish & Neave since 1964, and served as the Managing Partner between 1985 and 1991. He has been engaged in trial practice throughout the United States. He is the author of both practice materials and law school casebooks on patent law. He has testified at different times before Congress at its invitation on issues relating to innovation and patent law reform, served as a Special Master in patent litigation, and has written and spoken widely on intellectual property issues. Professor Schwartz has an LL.B. degree and an M.A. degree from the University of Pennsylvania and a B.S. degree from MIT.